CICC 2008: San Jose, California, USA

Keynote

Session 2 - Statistical modeling

Session 3 - Power management

Session 4 - High-speed test, characterization, and debug

Session 5 - Broadband circuit techniques for emerging wireless communications

Session 6 - Advanced SoC/SiP integration & co-design

Session 7 - High resolution converters

Session 8 - Characterization and test methods for device variability in nanoscale technologies

Session 9 - Broadband circuit techniques for emerging wireless communications

Session 10 - Panel discussion Sure, Moore's Law can continue, but should it

Session 11 - Compact modeling

Session 13 - Biomedical, sensors and MEMS

Session 14 - Advanced SoCs - techniques and applications

Session 15 - IC Technology - more Moore and more than Moore

Session 16 - Embedded memory

Session 17 - Clocking circuits

Session 18 - Millimeter-wave circuit techniques