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ORCIDETS 2009: Sevilla, Spain
- 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. IEEE Computer Society 2009, ISBN 978-0-7695-3703-0
Plenary Presentations
- Janusz Rajski:
We Have Got Compression, What Next? - Christian Landrault:
Something I Always Wanted to Know About Test, But Was Afraid to Ask.
Internal Testing of Mixed-Signal Cores
- Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. 3-8
Debug and Validation
- Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai:
Speed-Path Debug Using At-Speed Scan Test Patterns. 11-16 - Ho Fai Ko, Nicola Nicolici:
Resource-Efficient Programmable Trigger Units for Post-Silicon Validation. 17-22
Power Issues during Test
- Jaynarayan T. Tudu
, Erik Larsson, Virendra Singh, Vishwani D. Agrawal:
On Minimization of Peak Power for Scan Circuit during Test. 25-30
Selt-Test and Test Throughput
- Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Ishwar Parulkar:
Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors. 33-38 - Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. 39-44 - Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud:
Algorithms for ADC Multi-site Test with Digital Input Stimulus. 45-50
On-Line Testing
- Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich:
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. 53-58
Advanced Testing of Memories, Power Transistors and Microfluidic Systems
- Olivier Ginez, Jean-Michel Portal, Christophe Muller:
Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. 61-66 - Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. 67-72 - Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd:
Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems. 73-78
Recent Advances in ATPG
- Stephan Eggersglüß, Rolf Drechsler:
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques. 81-86 - Irith Pomeranz, Sudhakar M. Reddy:
Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation. 87-92 - Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda:
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. 93-98
Advanced External Testing of Mixed-Signals Cores
- Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect Filter for Alternate RF Test. 101-106 - Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada:
Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links. 107-112
Diagnosis and Dependability Analysis
- Mohammed Ashfaq Shukoor, Vishwani D. Agrawal:
A Two Phase Approach for Minimal Diagnostic Test Set Generation. 115-120 - Yasser Sedaghat, Seyed Ghassem Miremadi:
Categorizing and Analysis of Activated Faults in the FlexRay Communication Controller Registers. 121-126
Impact of Nanometer Technologies in the Testing Methodology
- Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. 129-134 - Josep Rius, Luis Elvira Villagra, Maurice Meijer:
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. 135-140
DfT and Embedded Test
- Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara:
Partial Scan Approach for Secret Information Protection. 143-148 - Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-values by Use of a Hierarchically Configurable Register. 149-154 - Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Test Encoding for Extreme Response Compaction. 155-160
ETS'08 Best Paper
- Rajeshwary Tayade, Jacob A. Abraham:
Critical Path Selection for Delay Test Considering Coupling Noise. 163-168
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