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ORCIDPattern Recognition, Volume 1
Volume 1, Number 1, July 1968
- Robert S. Ledley:
About this issue. Pattern Recognit. 1(1): 1-2 (1968) - Julius T. Tou:
Feature extraction in pattern recognition. 3-11 - Henry M. Beisner:
A recursive Bayesian approach to pattern recognition. 13-31 - Azriel Rosenfeld, John L. Pfaltz:
Distance functions on digital pictures. 33-61 - Ranan B. Banerji:
A language for pattern recognition. 63-74 - R. A. Dunn, R. A. Davidson:
Pattern recognition in biologic classification. 75-84
Volume 1, Number 2, November 1968
- Robert S. Ledley:
About this issue. Pattern Recognit. 1(2): 101-102 (1968) - Mary Elizabeth Stevens:
Selected pattern recognition projects in Europe. 103-118 - Marilyn Belson, Alden W. Dudley Jr., Robert S. Ledley:
Automatic computer measurements of neurons. 119-128 - Hewitt D. Crane, C. M. Steele:
Translation-tolerant mask matching using noncoherent reflective optics. 129-136 - Morton Nadler:
"Empyrean", an alternative paradigm for pattern recognition. 147-163 - Theodosios Pavlidis:
Analysis of set patterns. 165-178
Volume 1, Number 3, March 1969
- Robert S. Ledley:
About this issue. Pattern Recognit. 1(3): 185-186 (1969) - G. C. Cheng:
Pictorial pattern recognition. 187-188 - Tsuguchika Kaminuma, T. Takekawa, Satosi Watanabe:
Reduction of clustering problem to pattern recognition. 195-205 - J. J. Freeman:
Experiments in discrimination and classification. 207-218 - R. W. Sauvain, Leonard Uhr:
A teachable pattern describing and recognizing program. 219-232 - Toshiyuki Sakai, Makoto Nagao, Shinya Fujibayashi:
Line extraction and pattern detection in a photograph. 233-236
Volume 1, Number 4, July 1969
- Robert S. Ledley:
About this issue. Pattern Recognit. 1(4): 255-256 (1969) - Y. Shirai:
Automatic inspection of x-ray photograph of welding. 257-258 - Richard M. Brown:
Pattern recognition problems in bubble chamber physics. 263-271 - Julian R. Ullmann, P. A. Kidd:
Recognition experiments with typed numerals from envelopes in the mail. 273-289 - G. A. Butler:
A vector field approach to cluster analysis. 291-299 - R. Sherman, George W. Ernst:
Learning patterns in terms of other patterns. 301-313
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