BibTeX records: Andreas Aal

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@inproceedings{DBLP:conf/essderc/WarmuthGLCSKOPJ18,
  author       = {Jens Warmuth and
                  Kay{-}Uwe Giering and
                  Andr{\'{e}} Lange and
                  Andr{\'{e}} Clausner and
                  Simon Schlipf and
                  Gottfried Kurz and
                  Michael Otto and
                  Jens Paul and
                  Roland Jancke and
                  Andreas Aal and
                  Martin Gall and
                  Ehrenfried Zschech},
  title        = {Prediction of {SRAM} Reliability Under Mechanical Stress Induced by
                  Harsh En{\textsection}ironments},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {178--181},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486911},
  doi          = {10.1109/ESSDERC.2018.8486911},
  timestamp    = {Tue, 20 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/WarmuthGLCSKOPJ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/ClausnerSKOPGWL18,
  author       = {Andr{\'{e}} Clausner and
                  Simon Schlipf and
                  Gottfried Kurz and
                  Michael Otto and
                  Jens Paul and
                  Kay{-}Uwe Giering and
                  Jens Warmuth and
                  Andr{\'{e}} Lange and
                  Roland Jancke and
                  Andreas Aal and
                  R{\"{u}}diger Rosenkranz and
                  Martin Gall and
                  Ehrenfried Zschech},
  title        = {Analysis of 28 nm {SRAM} cell stability under mechanical load applied
                  by nanoindentation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353607},
  doi          = {10.1109/IRPS.2018.8353607},
  timestamp    = {Thu, 06 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ClausnerSKOPGWL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Aal16,
  author       = {Andreas Aal},
  title        = {Reliability management - The central enabler for advanced Technologies
                  in Automotive},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {13--18},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.117},
  doi          = {10.1016/J.MICROREL.2016.07.117},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Aal16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}