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ORCIDBibTeX records: Anshuman Chandra
@inproceedings{DBLP:conf/itc/ChandraKPTGSNTA23,
author = {Anshuman Chandra and
Moiz Khan and
Ankita Patidar and
Fumiaki Takashima and
Sandeep Kumar Goel and
Bharath Shankaranarayanan and
Vuong Nguyen and
Vistrita Tyagi and
Manish Arora},
title = {A Case Study on {IEEE} 1838 Compliant Multi-Die 3DIC {DFT} Implementation},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {11--20},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00011},
doi = {10.1109/ITC51656.2023.00011},
timestamp = {Tue, 09 Jan 2024 17:03:11 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChandraKPTGSNTA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChebiyamCK15,
author = {Subramanian Chebiyam and
Anshuman Chandra and
Rohit Kapur},
title = {Designing effective scan compression solutions for industrial circuits},
booktitle = {Sixteenth International Symposium on Quality Electronic Design, {ISQED}
2015, Santa Clara, CA, USA, March 2-4, 2015},
pages = {167--172},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ISQED.2015.7085418},
doi = {10.1109/ISQED.2015.7085418},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/ChebiyamCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vdat/ChandraKCK15,
author = {Anshuman Chandra and
Santosh Kulkarni and
Subramanian Chebiyam and
Rohit Kapur},
title = {Designing efficient combinational compression architecture for testing
industrial circuits},
booktitle = {19th International Symposium on {VLSI} Design and Test, {VDAT} 2015,
Ahmedabad, India, June 26-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ISVDAT.2015.7208149},
doi = {10.1109/ISVDAT.2015.7208149},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vdat/ChandraKCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraCK14,
author = {Anshuman Chandra and
Subramanian Chebiyam and
Rohit Kapur},
title = {A Case Study on Implementing Compressed {DFT} Architecture},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {336--341},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.68},
doi = {10.1109/ATS.2014.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraCK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BahlRKKCTNR14,
author = {Swapnil Bahl and
Shreyans Rungta and
Shray Khullar and
Rohit Kapur and
Anshuman Chandra and
Salvatore Talluto and
Pramod Notiyath and
Ajay Rajagopalan},
title = {Unifying scan compression},
booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
October 1-3, 2014},
pages = {191--196},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DFT.2014.6962079},
doi = {10.1109/DFT.2014.6962079},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BahlRKKCTNR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Chandra13,
author = {Anshuman Chandra},
title = {Special session 11B: Hot topic on-chip clocking - Industrial trends},
booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
April 29 - May 2, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/VTS.2013.6548942},
doi = {10.1109/VTS.2013.6548942},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Chandra13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/3dic/SyedCCK11,
author = {Uzair Shah Syed and
Krishnendu Chakrabarty and
Anshuman Chandra and
Rohit Kapur},
editor = {Mitsumasa Koyanagi and
Morihiro Kada},
title = {3D-Scalable Adaptive Scan {(3D-SAS)}},
booktitle = {2011 {IEEE} International 3D Systems Integration Conference (3DIC),
Osaka, Japan, January 31 - February 2, 2012},
pages = {1--6},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/3DIC.2012.6263043},
doi = {10.1109/3DIC.2012.6263043},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/3dic/SyedCCK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraSK11,
author = {Anshuman Chandra and
Jyotirmoy Saikia and
Rohit Kapur},
title = {Breaking the Test Application Time Barriers in Compression: Adaptive
Scan-Cyclical {(AS-C)}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {432--437},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.70},
doi = {10.1109/ATS.2011.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraKK09,
author = {Anshuman Chandra and
Rohit Kapur and
Yasunari Kanzawa},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Scalable Adaptive Scan {(SAS)}},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1476--1481},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090896},
doi = {10.1109/DATE.2009.5090896},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/ChandraKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChandraKK09,
author = {Anshuman Chandra and
Yasunari Kanzawa and
Rohit Kapur},
title = {Proactive management of X's in scan chains for compression},
booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED}
2009), 16-18 March 2009, San Jose, CA, {USA}},
pages = {260--265},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ISQED.2009.4810304},
doi = {10.1109/ISQED.2009.4810304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/ChandraKK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Not All Xs are Bad for Scan Compression},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.37},
doi = {10.1109/ATS.2008.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraNK08,
author = {Anshuman Chandra and
Felix Ng and
Rohit Kapur},
editor = {Donatella Sciuto},
title = {Low Power Illinois Scan Architecture for Simultaneous Power and Test
Data Volume Reduction},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {462--467},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484724},
doi = {10.1109/DATE.2008.4484724},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChandraNK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Interval Based X-Masking for Scan Compression Architectures},
booktitle = {9th International Symposium on Quality of Electronic Design {(ISQED}
2008), 17-19 March 2008, San Jose, CA, {USA}},
pages = {821--826},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ISQED.2008.4479844},
doi = {10.1109/ISQED.2008.4479844},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Bounded Adjacent Fill for Low Capture Power Scan Testing},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {131--138},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.47},
doi = {10.1109/VTS.2008.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/KapurFNCRWWAKFNU07,
author = {Rohit Kapur and
T. Finklea and
Felix Ng and
Anshuman Chandra and
Sanjay Ramnath and
Peter Wohl and
Thomas W. Williams and
Ashok Anbalan and
Sandeep S. Kulkarni and
Tammy Fernandes and
Pramod Notiyath and
Rajesh Uppuluri},
title = {{DFT} {MAX} and Power},
journal = {J. Low Power Electron.},
volume = {3},
number = {2},
pages = {199--205},
year = {2007},
url = {https://doi.org/10.1166/jolpe.2007.125},
doi = {10.1166/JOLPE.2007.125},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/KapurFNCRWWAKFNU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/HanHLLC07,
author = {Yinhe Han and
Yu Hu and
Xiaowei Li and
Huawei Li and
Anshuman Chandra},
title = {Embedded Test Decompressor to Reduce the Required Channels and Vector
Memory of Tester for Complex Processor Circuit},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {15},
number = {5},
pages = {531--540},
year = {2007},
url = {https://doi.org/10.1109/TVLSI.2007.893652},
doi = {10.1109/TVLSI.2007.893652},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/HanHLLC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraYK07,
author = {Anshuman Chandra and
Haihua Yan and
Rohit Kapur},
title = {Multimode Illinois Scan Architecture for Test Application Time and
Test Data Volume Reduction},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {84--92},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.39},
doi = {10.1109/VTS.2007.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraYK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/HanLLC06,
author = {Yinhe Han and
Huawei Li and
Xiaowei Li and
Anshuman Chandra},
title = {Response compaction for system-on-a-chip based on advanced convolutional
codes},
journal = {Sci. China Ser. {F} Inf. Sci.},
volume = {49},
number = {2},
pages = {262--272},
year = {2006},
url = {https://doi.org/10.1007/s11432-006-0262-0},
doi = {10.1007/S11432-006-0262-0},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/chinaf/HanLLC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tim/HanLLC06,
author = {Yinhe Han and
Xiaowei Li and
Huawei Li and
Anshuman Chandra},
title = {Embedded test resource for SoC to reduce required tester channels
based on advanced convolutional codes},
journal = {{IEEE} Trans. Instrum. Meas.},
volume = {55},
number = {2},
pages = {389--399},
year = {2006},
url = {https://doi.org/10.1109/TIM.2006.870332},
doi = {10.1109/TIM.2006.870332},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tim/HanLLC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HanHLLCW05,
author = {Yinhe Han and
Yu Hu and
Xiaowei Li and
Huawei Li and
Anshuman Chandra and
Xiaoqing Wen},
title = {Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded
Cores},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {88-D},
number = {9},
pages = {2126--2134},
year = {2005},
url = {https://doi.org/10.1093/ietisy/e88-d.9.2126},
doi = {10.1093/IETISY/E88-D.9.2126},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HanHLLCW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcst/HanLLC05,
author = {Yinhe Han and
Xiaowei Li and
Huawei Li and
Anshuman Chandra},
title = {Test Resource Partitioning Based on Efficient Response Compaction
for Test Time and Tester Channels Reduction},
journal = {J. Comput. Sci. Technol.},
volume = {20},
number = {2},
pages = {201--209},
year = {2005},
url = {https://doi.org/10.1007/s11390-005-0201-3},
doi = {10.1007/S11390-005-0201-3},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jcst/HanLLC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanLSHC05,
author = {Yinhe Han and
Xiaowei Li and
Shivakumar Swaminathan and
Yu Hu and
Anshuman Chandra},
title = {Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor},
booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
India},
pages = {372--377},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ATS.2005.96},
doi = {10.1109/ATS.2005.96},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HanLSHC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChandraC04,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Analysis of Test Application Time for Test Data Compression Methods
Based on Compression Codes},
journal = {J. Electron. Test.},
volume = {20},
number = {2},
pages = {199--212},
year = {2004},
url = {https://doi.org/10.1023/B:JETT.0000023682.41142.44},
doi = {10.1023/B:JETT.0000023682.41142.44},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ChandraC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanHLLC04,
author = {Yinhe Han and
Yu Hu and
Huawei Li and
Xiaowei Li and
Anshuman Chandra},
title = {Rapid and Energy-Efficient Testing for Embedded Cores},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {8--13},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.72},
doi = {10.1109/ATS.2004.72},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HanHLLC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HanHLLC04,
author = {Yinhe Han and
Yu Hu and
Huawei Li and
Xiaowei Li and
Anshuman Chandra},
title = {Response Compaction for Test Time and Test Pins Reduction Based on
Advanced Convolutional Codes},
booktitle = {19th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2004), 10-13 October 2004, Cannes, France,
Proceedings},
pages = {298--305},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/DFT.2004.54},
doi = {10.1109/DFT.2004.54},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/HanHLLC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ChandraC03,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Test Data Compression and Test Resource Partitioning for System-on-a-Chip
Using Frequency-Directed Run-Length {(FDR)} Codes},
journal = {{IEEE} Trans. Computers},
volume = {52},
number = {8},
pages = {1076--1088},
year = {2003},
url = {https://doi.org/10.1109/TC.2003.1223641},
doi = {10.1109/TC.2003.1223641},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/ChandraC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChandraC03,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {A unified approach to reduce {SOC} test data volume, scan power and
testing time},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {22},
number = {3},
pages = {352--363},
year = {2003},
url = {https://doi.org/10.1109/TCAD.2002.807895},
doi = {10.1109/TCAD.2002.807895},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ChandraC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanXLLC03,
author = {Yinhe Han and
Yongjun Xu and
Huawei Li and
Xiaowei Li and
Anshuman Chandra},
title = {Test Resource Partitioning Based on Efficient Response Compaction
for Test Time and Teste},
booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
China},
pages = {440--445},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ATS.2003.1250852},
doi = {10.1109/ATS.2003.1250852},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HanXLLC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/IyengarCSC03,
author = {Vikram Iyengar and
Anshuman Chandra and
Sharon Schweizer and
Krishnendu Chakrabarty},
title = {A Unified Approach for {SOC} Testing Using Test Data Compression and
{TAM} Optimization},
booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2003), 3-7 March 2003, Munich, Germany},
pages = {11188--11190},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10043},
doi = {10.1109/DATE.2003.10043},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/IyengarCSC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/IyengarC03,
author = {Vikram Iyengar and
Anshuman Chandra},
title = {A Uni.ed {SOC} Test Approach Based on Test Data Compression and {TAM}
Design},
booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA,
Proceedings},
pages = {511--518},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/DFTVS.2003.1250150},
doi = {10.1109/DFTVS.2003.1250150},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/IyengarC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/daglib/0029046,
author = {Krishnendu Chakrabarty and
Vikram Iyengar and
Anshuman Chandra},
title = {Test Resource Partitioning for System-on-a-Chip},
series = {Frontiers in electronic testing},
volume = {20},
publisher = {Kluwer / Springer},
year = {2002},
url = {http://www.springer.com/engineering/circuits+\%26+systems/book/978-1-4020-7119-5},
isbn = {978-1-4020-7119-5},
timestamp = {Tue, 04 Sep 2012 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/daglib/0029046.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChandraC02,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Low-power scan testing and test data compression forsystem-on-a-chip},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {5},
pages = {597--604},
year = {2002},
url = {https://doi.org/10.1109/43.998630},
doi = {10.1109/43.998630},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ChandraC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChandraC02a,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Test data compression and decompression based on internal scanchains
and Golomb coding},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {6},
pages = {715--722},
year = {2002},
url = {https://doi.org/10.1109/TCAD.2002.1004315},
doi = {10.1109/TCAD.2002.1004315},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ChandraC02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChandraC02,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Reduction of {SOC} test data volume, scan power and testing time using
alternating run-length codes},
booktitle = {Proceedings of the 39th Design Automation Conference, {DAC} 2002,
New Orleans, LA, USA, June 10-14, 2002},
pages = {673--678},
publisher = {{ACM}},
year = {2002},
url = {https://doi.org/10.1145/513918.514090},
doi = {10.1145/513918.514090},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ChandraC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraC02,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Test Resource Partitioning and Reduced Pin-Count Testing Based on
Test Data Compression},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2002), 4-8 March 2002, Paris, France},
pages = {598--603},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DATE.2002.998362},
doi = {10.1109/DATE.2002.998362},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChandraC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraCM02,
author = {Anshuman Chandra and
Krishnendu Chakrabarty and
Rafael A. Medina},
title = {How Effective are Compression Codes for Reducing Test Data Volume?},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011117},
doi = {10.1109/VTS.2002.1011117},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraCM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Test Resource Partitioning for SOCs},
journal = {{IEEE} Des. Test Comput.},
volume = {18},
number = {5},
pages = {80--91},
year = {2001},
url = {https://doi.org/10.1109/54.953275},
doi = {10.1109/54.953275},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {System-on-a-chip test-data compression and decompressionarchitectures
based on Golomb codes},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {20},
number = {3},
pages = {355--368},
year = {2001},
url = {https://doi.org/10.1109/43.913754},
doi = {10.1109/43.913754},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/vlsi/ChandraCH01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty and
Mark C. Hansen},
title = {Efficient Test Application for Core-Based Systems Using Twisted-Ring
Counters},
journal = {{VLSI} Design},
volume = {12},
number = {4},
pages = {475--486},
year = {2001},
url = {https://doi.org/10.1155/2001/75139},
doi = {10.1155/2001/75139},
timestamp = {Mon, 08 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/vlsi/ChandraCH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip},
booktitle = {Proceedings of the 38th Design Automation Conference, {DAC} 2001,
Las Vegas, NV, USA, June 18-22, 2001},
pages = {166--169},
publisher = {{ACM}},
year = {2001},
url = {https://doi.org/10.1145/378239.378396},
doi = {10.1145/378239.378396},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Efficient test data compression and decompression for system-on-a-chip
using internal scan chains and Golomb coding},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {145--149},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915015},
doi = {10.1109/DATE.2001.915015},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Frequency-Directed Run-Length {(FDR)} Codes with Application to System-on-a-Chip
Test Data Compression},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {42--47},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923416},
doi = {10.1109/VTS.2001.923416},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraC00,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Test Data Compression for System-on-a-Chip Using Golomb Codes},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {113--120},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843834},
doi = {10.1109/VTEST.2000.843834},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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