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BibTeX records: Jeongho Do
@inproceedings{DBLP:conf/isscc/SongJRKKPDPCJKC18, author = {Taejoong Song and Jonghoon Jung and Woojin Rim and Hoonki Kim and Yongho Kim and Changnam Park and Jeongho Do and Sunghyun Park and Sungwee Cho and Hyuntaek Jung and Bongjae Kwon and Hyun{-}Su Choi and Jaeseung Choi and Jong Shik Yoon}, title = {A 7nm FinFET {SRAM} using {EUV} lithography with dual write-driver-assist circuitry for low-voltage applications}, booktitle = {2018 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2018, San Francisco, CA, USA, February 11-15, 2018}, pages = {198--200}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ISSCC.2018.8310252}, doi = {10.1109/ISSCC.2018.8310252}, timestamp = {Fri, 14 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/SongJRKKPDPCJKC18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/SongKRKPPHYDLLK17, author = {Taejoong Song and Hoonki Kim and Woojin Rim and Yongho Kim and Sunghyun Park and Changnam Park and Minsun Hong and Giyong Yang and Jeongho Do and Jinyoung Lim and Seungyoung Lee and Ingyum Kim and Sanghoon Baek and Jonghoon Jung and Daewon Ha and Hyungsoon Jang and Taejung Lee and Chul{-}Hong Park and Bongjae Kwon and Hyuntaek Jung and Sungwee Cho and Yongjae Choo and Jaeseung Choi}, title = {12.2 {A} 7nm FinFET {SRAM} macro using {EUV} lithography for peripheral repair analysis}, booktitle = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2017, San Francisco, CA, USA, February 5-9, 2017}, pages = {208--209}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ISSCC.2017.7870334}, doi = {10.1109/ISSCC.2017.7870334}, timestamp = {Fri, 14 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/SongKRKPPHYDLLK17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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