BibTeX records: Jeongho Do

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@inproceedings{DBLP:conf/isscc/SongJRKKPDPCJKC18,
  author       = {Taejoong Song and
                  Jonghoon Jung and
                  Woojin Rim and
                  Hoonki Kim and
                  Yongho Kim and
                  Changnam Park and
                  Jeongho Do and
                  Sunghyun Park and
                  Sungwee Cho and
                  Hyuntaek Jung and
                  Bongjae Kwon and
                  Hyun{-}Su Choi and
                  Jaeseung Choi and
                  Jong Shik Yoon},
  title        = {A 7nm FinFET {SRAM} using {EUV} lithography with dual write-driver-assist
                  circuitry for low-voltage applications},
  booktitle    = {2018 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2018, San Francisco, CA, USA, February 11-15, 2018},
  pages        = {198--200},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ISSCC.2018.8310252},
  doi          = {10.1109/ISSCC.2018.8310252},
  timestamp    = {Fri, 14 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/SongJRKKPDPCJKC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isscc/SongKRKPPHYDLLK17,
  author       = {Taejoong Song and
                  Hoonki Kim and
                  Woojin Rim and
                  Yongho Kim and
                  Sunghyun Park and
                  Changnam Park and
                  Minsun Hong and
                  Giyong Yang and
                  Jeongho Do and
                  Jinyoung Lim and
                  Seungyoung Lee and
                  Ingyum Kim and
                  Sanghoon Baek and
                  Jonghoon Jung and
                  Daewon Ha and
                  Hyungsoon Jang and
                  Taejung Lee and
                  Chul{-}Hong Park and
                  Bongjae Kwon and
                  Hyuntaek Jung and
                  Sungwee Cho and
                  Yongjae Choo and
                  Jaeseung Choi},
  title        = {12.2 {A} 7nm FinFET {SRAM} macro using {EUV} lithography for peripheral
                  repair analysis},
  booktitle    = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2017, San Francisco, CA, USA, February 5-9, 2017},
  pages        = {208--209},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ISSCC.2017.7870334},
  doi          = {10.1109/ISSCC.2017.7870334},
  timestamp    = {Fri, 14 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/SongKRKPPHYDLLK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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