BibTeX records: Neal Jaarsma

• > Home > Persons > Neal Jaarsma

@inproceedings{DBLP:conf/ats/KhusyariNJANAO08,
  author       = {Khairul Khusyari and
                  Wei Tee Ng and
                  Neal Jaarsma and
                  Robert Abraham and
                  Peng Weng Ng and
                  Boon Hui Ang and
                  Chin Hu Ong},
  title        = {Diagnosis of Voltage Dependent Scan Chain Failure Using {VBUMP} Scan
                  Debug Method},
  booktitle    = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
                  24-27, 2008},
  pages        = {271},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ATS.2008.66},
  doi          = {10.1109/ATS.2008.66},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KhusyariNJANAO08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MaxwellOADJQW00,
  author       = {Peter C. Maxwell and
                  Pete O'Neill and
                  Robert C. Aitken and
                  Ronald Dudley and
                  Neal Jaarsma and
                  Minh Quach and
                  Don Wiseman},
  title        = {Current ratios: a self-scaling technique for production {IDDQ} testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {1148--1156},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894324},
  doi          = {10.1109/TEST.2000.894324},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MaxwellOADJQW00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MaxwellOADJQW99,
  author       = {Peter C. Maxwell and
                  Pete O'Neill and
                  Robert C. Aitken and
                  Ronald Dudley and
                  Neal Jaarsma and
                  Minh Quach and
                  Don Wiseman},
  title        = {Current ratios: a self-scaling technique for production I{\_}DDQ testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {738--746},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805803},
  doi          = {10.1109/TEST.1999.805803},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MaxwellOADJQW99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}