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BibTeX records: Kangwook Jo
@inproceedings{DBLP:conf/isscc/KimLHPPJNSLSCJAPOKKPLWKKCCPYLPHKCJCCC23, author = {Bvunarvul Kim and Seungpil Lee and Beomseok Hah and Kanawoo Park and Yongsoon Park and Kangwook Jo and Yujong Noh and Hyeon{-}Cheon Seol and Hyunsoo Lee and Jae{-}Hyeon Shin and Seongjin Choi and Youngdon Jung and Sungho Ahn and Yonghun Park and Sujeong Oh and Myungsu Kim and Seonauk Kim and Hyunwook Park and Taeho Lee and Haeun Won and Minsung Kim and Cheulhee Koo and Yeonjoo Choi and Suyoung Choi and Sechun Park and Dongkyu Youn and Junyoun Lim and Wonsun Park and Hwang Hur and Kichang Kwean and Hongsok Choi and Woopyo Jeong and Sungyong Chung and Jungdal Choi and Seonyong Cha}, title = {A High-Performance 1Tb 3b/Cell 3D-NAND Flash with a 194MB/s Write Throughput on over 300 Layers {\textdollar}{\textbackslash}mathsf\{i\}{\textdollar}}, booktitle = {{IEEE} International Solid- State Circuits Conference, {ISSCC} 2023, San Francisco, CA, USA, February 19-23, 2023}, pages = {402--403}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ISSCC42615.2023.10067666}, doi = {10.1109/ISSCC42615.2023.10067666}, timestamp = {Wed, 29 Mar 2023 15:53:39 +0200}, biburl = {https://dblp.org/rec/conf/isscc/KimLHPPJNSLSCJAPOKKPLWKKCCPYLPHKCJCCC23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/HuhCLNPOKCLKPKL20, author = {Hwang Huh and Wanik Cho and Jinhaeng Lee and Yujong Noh and Yongsoon Park and Sunghwa Ok and Jongwoo Kim and Kayoung Cho and Hyunchul Lee and Geonu Kim and Kangwoo Park and Kwanho Kim and Heejoo Lee and Sooyeol Chai and Chankeun Kwon and Hanna Cho and Chanhui Jeong and Yujin Yang and Jayoon Goo and Jangwon Park and Juhyeong Lee and Heonki Kirr and Kangwook Jo and Cheoljoong Park and Hyeonsu Nam and Hyunseok Song and Sangkyu Lee and Woopyo Jeong and Kun{-}Ok Ahn and Tae{-}Sung Jung}, title = {13.2 {A} 1Tb 4b/Cell 96-Stacked-WL 3D {NAND} Flash Memory with 30MB/s Program Throughput Using Peripheral Circuit Under Memory Cell Array Technique}, booktitle = {2020 {IEEE} International Solid- State Circuits Conference, {ISSCC} 2020, San Francisco, CA, USA, February 16-20, 2020}, pages = {220--221}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/ISSCC19947.2020.9063117}, doi = {10.1109/ISSCC19947.2020.9063117}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/HuhCLNPOKCLKPKL20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcas/JoY17, author = {Kangwook Jo and Hongil Yoon}, title = {Variation-Tolerant Sensing Circuit for Ultralow-Voltage Operation of Spin-Torque Transfer Magnetic {RAM}}, journal = {{IEEE} Trans. Circuits Syst. {II} Express Briefs}, volume = {64-II}, number = {5}, pages = {570--574}, year = {2017}, url = {https://doi.org/10.1109/TCSII.2016.2581038}, doi = {10.1109/TCSII.2016.2581038}, timestamp = {Wed, 27 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcas/JoY17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isocc/JoCY16, author = {Kangwook Jo and Kyungseon Cho and Hongil Yoon}, title = {Variation-tolerant and low power look-up table {(LUT)} using spin-torque transfer magnetic {RAM} for non-volatile field programmable gate array {(FPGA)}}, booktitle = {International SoC Design Conference, {ISOCC} 2016, Jeju, South Korea, October 23-26, 2016}, pages = {101--102}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/ISOCC.2016.7799753}, doi = {10.1109/ISOCC.2016.7799753}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isocc/JoCY16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isocc/ParkLPKRJJLYJCK12, author = {Jaeseok Park and Ingeol Lee and Young{-}Seok Park and Sung{-}Geun Kim and Kyungho Ryu and Dong{-}Hoon Jung and Kangwook Jo and Choong Keun Lee and Hongil Yoon and Seong{-}Ook Jung and Woo{-}Young Choi and Sungho Kang}, title = {Integration of dual channel timing formatter system for high speed memory test equipment}, booktitle = {International SoC Design Conference, {ISOCC} 2012, Jeju Island, South Korea, November 4-7, 2012}, pages = {185--187}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ISOCC.2012.6407070}, doi = {10.1109/ISOCC.2012.6407070}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isocc/ParkLPKRJJLYJCK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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