BibTeX records: Anthony S. Oates

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@inproceedings{DBLP:conf/irps/FangO18,
  author       = {Yi{-}Pin Fang and
                  Anthony S. Oates},
  title        = {Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353584},
  doi          = {10.1109/IRPS.2018.8353584},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FangO18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsi-dat/Oates14,
  author       = {Anthony S. Oates},
  title        = {Will reliability limit Moore's law?},
  booktitle    = {Technical Papers of 2014 International Symposium on {VLSI} Design,
                  Automation and Test, {VLSI-DAT} 2014, Hsinchu, Taiwan, April 28-30,
                  2014},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSI-DAT.2014.6834930},
  doi          = {10.1109/VLSI-DAT.2014.6834930},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/Oates14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/Oates12,
  author       = {Anthony S. Oates},
  title        = {Reliability challenges for the continued scaling of {IC} technologies},
  booktitle    = {Proceedings of the {IEEE} 2012 Custom Integrated Circuits Conference,
                  {CICC} 2012, San Jose, CA, USA, September 9-12, 2012},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/CICC.2012.6330658},
  doi          = {10.1109/CICC.2012.6330658},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/Oates12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/esscirc/RyanWCSCOWS11,
  author       = {Jason T. Ryan and
                  Lan Wei and
                  Jason P. Campbell and
                  Ricki G. Southwick and
                  Kin P. Cheung and
                  Anthony S. Oates and
                  H.{-}S. Philip Wong and
                  John Suehle},
  title        = {Circuit-aware device reliability criteria methodology},
  booktitle    = {Proceedings of the 37th European Solid-State Circuits Conference,
                  {ESSCIRC} 2011, Helsinki, Finland, Sept. 12-16, 2011},
  pages        = {255--258},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ESSCIRC.2011.6044955},
  doi          = {10.1109/ESSCIRC.2011.6044955},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/RyanWCSCOWS11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iccad/VaidyanathanOX09,
  author       = {Balaji Vaidyanathan and
                  Anthony S. Oates and
                  Yuan Xie},
  editor       = {Jaijeet S. Roychowdhury},
  title        = {Intrinsic NBTI-variability aware statistical pipeline performance
                  assessment and tuning},
  booktitle    = {2009 International Conference on Computer-Aided Design, {ICCAD} 2009,
                  San Jose, CA, USA, November 2-5, 2009},
  pages        = {164--171},
  publisher    = {{ACM}},
  year         = {2009},
  url          = {https://doi.org/10.1145/1687399.1687429},
  doi          = {10.1145/1687399.1687429},
  timestamp    = {Mon, 09 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/VaidyanathanOX09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isqed/VaidyanathanOXW09,
  author       = {Balaji Vaidyanathan and
                  Anthony S. Oates and
                  Yuan Xie and
                  Yu Wang},
  title        = {NBTI-aware statistical circuit delay assessment},
  booktitle    = {10th International Symposium on Quality of Electronic Design {(ISQED}
                  2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages        = {13--18},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISQED.2009.4810263},
  doi          = {10.1109/ISQED.2009.4810263},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/VaidyanathanOXW09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}