BibTeX records: Tomoaki Oba

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@inproceedings{DBLP:conf/essderc/KawanagoOITO18,
  author       = {Takamasa Kawanago and
                  Tomoaki Oba and
                  Ryo Ikoma and
                  Hiroyuki Takagi and
                  Shunri Oda},
  title        = {Gated Four-Probe Method to Evaluate the Impact of {SAM} Gate Dielectric
                  on Mobility in MoS2 {FET}},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {118--121},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486878},
  doi          = {10.1109/ESSDERC.2018.8486878},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/KawanagoOITO18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/KawanagoIOT17,
  author       = {Takamasa Kawanago and
                  Ryo Ikoma and
                  Tomoaki Oba and
                  Hiroyuki Takagi},
  title        = {Radical oxidation process for hybrid SAM/HfOx gate dielectrics in
                  MoS2 FETs},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {114--117},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066605},
  doi          = {10.1109/ESSDERC.2017.8066605},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/KawanagoIOT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}