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S. Kuboyama

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2005
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  - https://dblp.org/rec/journals/mr/HayamaTOKMRMSC05
Kiyoteru Hayama, Kenichiro Takakura, Hidenori Ohyama, S. Kuboyama, S. Matsuda, Joan Marc Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys:
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectron. Reliab. 45(9-11): 1376-1381 (2005)

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