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D. K. Kuhn

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2007
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K. W. Alt, R. E. Yeats, C. P. Hutchinson, D. K. Kuhn, T. S. Low, M. Iwamoto, M. E. Adamski, R. L. Shimon, Timothy E. Shirley, M. Bonse, F. G. Kellert, D. C. D'Avanzo:
Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology. Microelectron. Reliab. 47(8): 1175-1179 (2007)

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