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Cristina Meinhardt
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- affiliation: Federal University of Rio Grande, Brazil
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2020 – today
- 2023
- [c82]Bryan Martins Lima, Naiara Sachetti, Augusto Andre Souza Berndt, Cristina Meinhardt, Jônata Tyska Carvalho:
Adaptive Batch Size CGP: Improving Accuracy and Runtime for CGP Logic Optimization Flow. EuroGP 2023: 149-164 - [c81]Gabriel Lima Jacinto, Cínthia Schneider, Alexandra L. Zimpeck, Mateus Grellert, Cristina Meinhardt:
Fast and Low-Error Prediction of Logic Gate Cell Characterization. ICECS 2023: 1-4 - [c80]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt:
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS 2023: 1-5 - [c79]Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt:
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI 2023: 1-6 - [c78]Vinicius Zanandrea, Cristina Meinhardt:
New Modified 4:2 Approximate Compressors for Low-Power Applications. SBCCI 2023: 1-6 - 2022
- [j14]Talita Alves Borges, Vagner Santos Da Rosa, Cristina Meinhardt, Leonardo Bandeira Soares:
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing. IEEE Des. Test 39(2): 31-37 (2022) - [j13]Fábio G. R. G. da Silva, Rafael N. M. Oliveira, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology. Integr. 87: 137-146 (2022) - [j12]Augusto Andre Souza Berndt, Cristina Meinhardt, André Inácio Reis, Paulo F. Butzen:
Optimizing machine learning logic circuits with constant signal propagation. Integr. 87: 293-305 (2022) - [c77]Sheiny Fabre Almeida, Aysa Fakheri Tabrizi, Erfan Aghaeekiasaraee, Renan Netto, Tiago Augusto Fontana, Upma Gandhi, José Luís Güntzel, Laleh Behjat, Cristina Meinhardt:
E-RVP: An Initial Design Rule Violation Predictor Using Placement Information. ICECS 2022 2022: 1-4 - [c76]Marcio Monteiro, Ismael Seidel, Mateus Grellert, José Luís Güntzel, Leonardo Bandeira Soares, Cristina Meinhardt:
Exploring the Impacts of Multiple Kernel Sizes of Gaussian Filters Combined to Approximate Computing in Canny Edge Detection. LASCAS 2022: 1-4 - [c75]Rodrigo H. Müller, Cristina Meinhardt, Odorico M. Mendizabal:
An architecture proposal for checkpoint/restore on stateful containers. SAC 2022: 267-270 - [c74]Gabriel Lima Jacinto, Lucas Yuki Imamura, Mateus Grellert, Cristina Meinhardt:
Exploring Machine Learning for Electrical Behavior Prediction: The CMOS Inverter Case Study. SBCCI 2022: 1-6 - [c73]Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt:
Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. SBCCI 2022: 1-6 - [c72]Sheiny Fabre Almeida, José Luís Güntzel, Laleh Behjat, Cristina Meinhardt:
Routability-Driven Detailed Placement Using Reinforcement Learning. VLSI-SoC 2022: 1-2 - [c71]Pedro Aquino Silva, Mateus Grellert, Cristina Meinhardt:
Exploring Approximate Comparator Circuits on Power Efficient Design of Decision Trees. VLSI-SoC 2022: 1-6 - [c70]Pedro Aquino Silva, Mateus Grellert, Cristina Meinhardt:
Approximation Workflow for Energy-Efficient Comparators in Decision Tree Applications. VLSI-SoC 2022: 1-2 - [c69]Vinicius Zanandrea, Cristina Meinhardt:
Exploring Approximate Computing Approaches to Design Power-efficient Multipliers. VLSI-SoC 2022: 1-2 - 2021
- [j11]Cleiton Magano Marques, Cristina Meinhardt, Paulo Francisco Butzen:
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions. J. Electron. Test. 37(2): 263-270 (2021) - [c68]Shubham Rai, Walter Lau Neto, Yukio Miyasaka, Xinpei Zhang, Mingfei Yu, Qingyang Yi, Masahiro Fujita, Guilherme B. Manske, Matheus F. Pontes, Leomar S. da Rosa, Marilton S. de Aguiar, Paulo F. Butzen, Po-Chun Chien, Yu-Shan Huang, Hoa-Ren Wang, Jie-Hong R. Jiang, Jiaqi Gu, Zheng Zhao, Zixuan Jiang, David Z. Pan, Brunno A. Abreu, Isac de Souza Campos, Augusto Andre Souza Berndt, Cristina Meinhardt, Jônata Tyska Carvalho, Mateus Grellert, Sergio Bampi, Aditya Lohana, Akash Kumar, Wei Zeng, Azadeh Davoodi, Rasit Onur Topaloglu, Yuan Zhou, Jordan Dotzel, Yichi Zhang, Hanyu Wang, Zhiru Zhang, Valerio Tenace, Pierre-Emmanuel Gaillardon, Alan Mishchenko, Satrajit Chatterjee:
Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization. DATE 2021: 1026-1031 - [c67]Brunno A. Abreu, Augusto Andre Souza Berndt, Isac de Souza Campos, Cristina Meinhardt, Jônata Tyska Carvalho, Mateus Grellert, Sergio Bampi:
Fast Logic Optimization Using Decision Trees. ISCAS 2021: 1-5 - [c66]Marcio Monteiro, Pedro Aquino Silva, Ismael Seidel, Mateus Grellert, Leonardo Bandeira Soares, José Luís Güntzel, Cristina Meinhardt:
Design of Energy-Efficient Gaussian Filters by Combining Refactoring and Approximate Adders. ISCAS 2021: 1-5 - [c65]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS 2021: 1-4 - [c64]Maria Eduarda de Melo Hang, Cleiton Magano Marques, Paulo F. Butzen, Cristina Meinhardt:
Soft Error Sensibility Window at FinFET DICE SRAM. LASCAS 2021: 1-4 - [c63]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Current Behavior on Process Variability Aware FinFET Inverter Designs. LASCAS 2021: 1-4 - [c62]Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Cristina Meinhardt:
SET Mitigation Techniques on Mirror Full Adder at 7 nm FinFET Technology. LATS 2021: 1-2 - [c61]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt:
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS 2021: 1-6 - [c60]Luiz Gustavo Coutinho Xavier, Fernando Luís Dotti, Cristina Meinhardt, Odorico M. Mendizabal:
Shrinking Logs by Safely Discarding Commands. SBRC 2021: 588-601 - 2020
- [j10]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(2): 553-564 (2020) - [c59]Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Cristina Meinhardt:
Mirror Full Adder SET Susceptibility on 7nm FinFET Technology. ICECS 2020: 1-4 - [c58]Pedro Aquino Silva, Cristina Meinhardt:
Energy-Efficient Design of Approximated Full Adders. ICECS 2020: 1-4 - [c57]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Pros and Cons of ST and SIG FinFET Inverters for Low Power Designs. ISCAS 2020: 1-5 - [c56]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS 2020: 1-6 - [c55]Cleiton Magano Marques, Cristina Meinhardt, Paulo F. Butzen:
Soft Error Reliability of SRAM cells during the three operation states. LATS 2020: 1-6 - [c54]Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes:
Circuit Level Design Methods to Mitigate Soft Errors. LATS 2020: 1-3 - [c53]Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Reis:
Mitigation Effects of Decoupling Cells on Full Adders Process Variability. MWSCAS 2020: 317-320 - [c52]Talita Alves Borges, Leonardo Bandeira Soares, Cristina Meinhardt:
A Fine-grained Methodology for Accuracy-configurable and Energy-efficient Gaussian Filters Design. SBCCI 2020: 1-6 - [c51]Luiz Gustavo Coutinho Xavier, Fernando Luís Dotti, Cristina Meinhardt, Odorico Machado Mendizabal:
Scalable and Decoupled Logging for State Machine Replication. SBRC 2020: 267-280 - [i1]Shubham Rai, Walter Lau Neto, Yukio Miyasaka, Xinpei Zhang, Mingfei Yu, Qingyang Yi, Masahiro Fujita, Guilherme B. Manske, Matheus F. Pontes, Leomar S. da Rosa Jr., Marilton S. de Aguiar, Paulo F. Butzen, Po-Chun Chien, Yu-Shan Huang, Hoa-Ren Wang, Jie-Hong R. Jiang, Jiaqi Gu, Zheng Zhao, Zixuan Jiang, David Z. Pan, Brunno A. Abreu, Isac de Souza Campos, Augusto Andre Souza Berndt, Cristina Meinhardt, Jônata Tyska Carvalho, Mateus Grellert, Sergio Bampi, Aditya Lohana, Akash Kumar, Wei Zeng, Azadeh Davoodi, Rasit Onur Topaloglu, Yuan Zhou, Jordan Dotzel, Yichi Zhang, Hanyu Wang, Zhiru Zhang, Valerio Tenace, Pierre-Emmanuel Gaillardon, Alan Mishchenko, Satrajit Chatterjee:
Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization. CoRR abs/2012.02530 (2020)
2010 – 2019
- 2019
- [c50]Jorge Ferreira, Paulo F. Butzen, Cristina Meinhardt, Ricardo A. L. Reis:
FBM: A Simple and Fast Algorithm for Placement Legalization. ICECS 2019: 209-212 - [c49]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. ICECS 2019: 582-585 - [c48]Rafael N. M. Oliveira, Alan D. Lüdke, Cristina Meinhardt:
Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology. ICECS 2019: 590-593 - [c47]Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
FinFET Variability and Near-threshold operation: Impact on Full Adders design using XOR Blocks. ICECS 2019: 638-641 - [c46]Samuel Presa Toledo, Ricardo Reis, Cristina Meinhardt:
Process Variability Challenges for Radiation Mitigation Techniques on 16nm. LASCAS 2019: 69-72 - [c45]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Exploring Schmitt Trigger Circuits for Process Variability Mitigation. NEWCAS 2019: 1-4 - [c44]Paola Martins Pereira, Fernando Luís Dotti, Cristina Meinhardt, Odorico Machado Mendizabal:
A library for services transparent replication. SAC 2019: 268-275 - [c43]Leonardo B. Moraes, Alexandra Lackmann Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Robust FinFET Schmitt Trigger Designs for Low Power Applications. VLSI-SoC (Selected Papers) 2019: 45-68 - [c42]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability. VLSI-SoC 2019: 88-93 - [c41]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) 2019: 89-113 - [c40]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC 2019: 179-184 - [c39]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC 2019: 240-241 - [c38]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Robustness and Minimum Energy-Oriented FinFET Design. VLSI-SoC 2019: 247-248 - [c37]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC 2019: 249-250 - 2018
- [j9]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Impact of different transistor arrangements on gate variability. Microelectron. Reliab. 88-90: 111-115 (2018) - [j8]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Evaluation of variability using Schmitt trigger on full adders layout. Microelectron. Reliab. 88-90: 116-121 (2018) - [j7]Roberto B. Almeida, Cleiton Magano Marques, Paulo F. Butzen, Fábio G. R. G. da Silva, Ricardo A. L. Reis, Cristina Meinhardt:
Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. Microelectron. Reliab. 88-90: 196-202 (2018) - [c36]Gustavo L. Lima, Nelson de Farias Traversi, Diana Francisca Adamatti, Graçaliz Pereira Dimuro, Cristina Meinhardt, Eduardo Wenzel Brião, Odorico Machado Mendizabal:
Exploring MAS to a High Level Abstration NoC Simulation Environment. ICECS 2018: 365-368 - [c35]Fabio G. Rossato G. da Silva, Cristina Meinhardt, Ricardo Reis:
Impact of Near-Threshold and Variability on 7nm FinFET XOR Circuits. ICECS 2018: 573-576 - [c34]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS 2018: 581-584 - [c33]Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt:
Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders. ISCAS 2018: 1-5 - [c32]Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen:
Reliability evaluation of circuits designed in multi- and single-stage versions. LASCAS 2018: 1-4 - [c31]Roberto B. Almeida, Paulo F. Butzen, Cristina Meinhardt:
16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and Aging Effects. SBCCI 2018: 1-6 - [c30]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC 2018: 71-76 - 2017
- [j6]Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis:
Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectron. Reliab. 76-77: 655-659 (2017) - [j5]Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. 76-77: 660-664 (2017) - [c29]Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. ICECS 2017: 270-273 - [c28]Y. Q. de Aguiar, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
SET response of FinFET-based majority voter circuits under work-function fluctuation. ICECS 2017: 282-285 - [c27]Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt:
Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders. ICECS 2017: 290-293 - [c26]Giane Ulloa, Vinicius Lucena, Cristina Meinhardt:
Comparing 32nm full adder TMR and DTMR architectures. ICECS 2017: 294-297 - [c25]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Robustness of Sub-22nm multigate devices against physical variability. ISCAS 2017: 1-4 - [c24]Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis:
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. LASCAS 2017: 1-4 - 2016
- [j4]Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Permanent and single event transient faults reliability evaluation EDA tool. Microelectron. Reliab. 64: 63-67 (2016) - [c23]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Geometric variability impact on 7nm Trigate combinational cells. ICECS 2016: 9-12 - [c22]Fábio G. R. G. da Silva, Paulo F. Butzen, Cristina Meinhardt:
PVT variability analysis of FinFET and CMOS XOR circuits at 16nm. ICECS 2016: 528-531 - [c21]Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Augusto da Luz Reis:
FinFET cells with different transistor sizing techniques against PVT variations. ISCAS 2016: 45-48 - [c20]Rafael B. Schivittz, Denis Teixeira Franco, Cristina Meinhardt, Paulo F. Butzen:
A probabilistic model for stuck-on faults in combinational logic gates. LATS 2016: 39-44 - [c19]Eduardo Liebl, Cristina Meinhardt, Paulo F. Butzen:
Reliability analysis of majority voters under permanent faults. LATS 2016: 180 - [c18]Stephanie O. Ames, Vinicius Zanandrea, Ingrid F. V. Oliveira, Samuel P. Toledo, Cristina Meinhardt:
Investigating PVT variability effects on full adders. PATMOS 2016: 155-161 - [c17]Rafael B. Schivittz, Rafael Fritz, Denis Teixeira Franco, Lirida A. B. Naviner, Cristina Meinhardt, Paulo F. Butzen:
Inserting permanent fault input dependence on PTM to improve robustness evaluation. SBCCI 2016: 1-6 - 2015
- [j3]Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Impact of PVT variability on 20 nm FinFET standard cells. Microelectron. Reliab. 55(9-10): 1379-1383 (2015) - [c16]Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis:
Process variability in FinFET standard cells with different transistor sizing techniques. ICECS 2015: 121-124 - [c15]Rafael B. Schivittz, Cristina Meinhardt, Paulo F. Butzen:
An evaluation of BTI degradation of 32nm standard cells. ICECS 2015: 661-664 - 2014
- [j2]Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis:
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. Microelectron. Reliab. 54(9-10): 2319-2324 (2014) - [c14]Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo Augusto da Luz Reis:
Impact of gate workfunction fluctuation on FinFET standard cells. ICECS 2014: 574-577 - [c13]Gracieli Posser, Jozeanne Belomo, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Perfomance Improvement with Dedicated Transistor Sizing for MOSFET and FinFET Devices. ISVLSI 2014: 418-423 - [c12]Cristina Meinhardt, Ricardo Reis:
Comparing high-performance cells in CMOS bulk and FinFET technologies. LASCAS 2014: 1-4 - [c11]Marco Terres, Cristina Meinhardt, Guilherme Bontorin, Ricardo Reis:
Exploring more efficient architectures for Multiple Dynamic Supply Voltage designs. LASCAS 2014: 1-4 - [c10]Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices. PATMOS 2014: 1-8 - 2013
- [c9]Marco Terres, Cristina Meinhardt, Guilherme Bontorin, Ricardo Reis:
A novel approach to reduce power consumption in level shifter for Multiple Dynamic Supply Voltage. ICECS 2013: 715-718 - [c8]Cristina Meinhardt, Ricardo Reis:
A yield-driven regular layout synthesis. ISVLSI 2013: 221-222 - [c7]Cristina Meinhardt, Ricardo Reis:
FinFET basic cells evaluation for regular layouts. LASCAS 2013: 1-4 - 2011
- [j1]Massimo Violante, Cristina Meinhardt, Ricardo Reis, Matteo Sonza Reorda:
A Low-Cost Solution for Deploying Processor Cores in Harsh Environments. IEEE Trans. Ind. Electron. 58(7): 2617-2626 (2011)
2000 – 2009
- 2009
- [c6]Matteo Sonza Reorda, Massimo Violante, Cristina Meinhardt, Ricardo Reis:
A low-cost SEE mitigation solution for soft-processors embedded in Systems on Pogrammable Chips. DATE 2009: 352-357 - [c5]Matteo Sonza Reorda, Massimo Violante, Cristina Meinhardt, Ricardo Reis:
An On-board Data-Handling Computer for Deep-Space Exploration Built Using Commercial-Off-the-Shelf SRAM-Based FPGAs. DFT 2009: 254-262 - [c4]Cristina Meinhardt, Ricardo Reis, Massimo Violante, Matteo Sonza Reorda:
Recovery scheme for hardening system on programmable chips. LATW 2009: 1-6 - 2007
- [c3]Cristina Meinhardt, Ricardo Reis, Reginaldo Tavares:
Logic and Physical Synthesis of Cell Arrays. ICECS 2007: 1292-1295 - 2006
- [c2]Reginaldo Tavares, Cristina Meinhardt, Ricardo Reis:
orBDDs Direct Mapping for Structured Logic Circuits. ICECS 2006: 1057-1060 - [c1]Claudio Menezes, Cristina Meinhardt, Ricardo Reis, Reginaldo Tavares:
A Regular Layout Approach for ASICs. ISVLSI 2006: 424-425
Coauthor Index
aka: Paulo Francisco Butzen
aka: Fabio G. Rossato G. da Silva
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