A. Asenov

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Salvatore M. Amoroso

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Publications

2018
[c47]
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  - conf/date/UhligLLRDNDOKGA18
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Benjamin Uhlig, Jie Liang, Jaehyun Lee, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asen Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingan Chen, Reeturaj Pandey, R. Chen, Aida Todri-Sanial:
Progress on carbon nanotube BEOL interconnects. DATE 2018: 937-942
2015
[j35]
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  - journals/mr/GerrerGATA15
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Louis Gerrer, Vihar P. Georgiev, Salvatore M. Amoroso, Ewan Towie, A. Asenov:
Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. Microelectron. Reliab. 55(9-10): 1307-1312 (2015)
[c40]
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  - conf/essderc/GerrerHAFWSHKGA15
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Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov:
Experimental evidences and simulations of trap generation along a percolation path. ESSDERC 2015: 226-229
[c39]
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  - conf/essderc/HussinGDWACRWSF15
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Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov:
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC 2015: 238-241
[c38]
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  - conf/iscas/AsenovDRAAAG15
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A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer:
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. ISCAS 2015: 2449-2452
2014
[j34]
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  - journals/mr/GerrerDAAHRMA14
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Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov:
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54(4): 682-697 (2014)
[j32]
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  - journals/mr/GerrerAHA14
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Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov:
RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. 54(9-10): 1749-1752 (2014)
[c35]
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  - conf/essderc/GeorgievAVBCA14
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Vihar P. Georgiev, Salvatore M. Amoroso, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov:
FDSOI molecular flash cell with reduced variability for low power flash applications. ESSDERC 2014: 353-356
2012
[j26]
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  - journals/mr/GerrerMAAA12
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Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov:
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. Microelectron. Reliab. 52(9-10): 1918-1923 (2012)
[c26]
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  - conf/essderc/AmorosoGMAA12
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Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov:
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC 2012: 109-112

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