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Hiroyuki Ota

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Wataru Mizubayashi

> Home > Persons > Hiroyuki Ota

Publications

2015
[c9]
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  dblp key:
  - conf/icicdt/MizubayashiMFLM15
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  persistent URL:
  - https://dblp.org/rec/conf/icicdt/MizubayashiMFLM15
Wataru Mizubayashi, Takahiro Mori, Koichi Fukuda, Yongxun Liu, Takashi Matsukawa, Yuki Ishikawa, Kazuhiko Endo, Shin-ichi O'Uchi, Junichi Tsukada, Hiromi Yamauchi, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Meishoku Masahara:
PBTI for N-type tunnel FinFETs. ICICDT 2015: 1-4
2014
[c8]
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  dblp key:
  - conf/essderc/MoritaMMMFMEOLMO14
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  persistent URL:
  - https://dblp.org/rec/conf/essderc/MoritaMMMFMEOLMO14
Yukinori Morita, Takahiro Mori, Shinji Migita, Wataru Mizubayashi, Koichi Fukuda, Takashi Matsukawa, Kazuhiko Endo, Shin-ichi O'Uchi, Yongxun Liu, Meishoku Masahara, Hiroyuki Ota:
Improvement of epitaxial channel quality on heavily arsenic- and boron-doped Si surfaces and impact on tunnel FET performance. ESSDERC 2014: 182-185
[c7]
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  - conf/essderc/MigitaMMFMMELOMO14
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  - https://dblp.org/rec/conf/essderc/MigitaMMFMMELOMO14
Shinji Migita, Takashi Matsukawa, Takahiro Mori, Koichi Fukuda, Yukinori Morita, Wataru Mizubayashi, Kazuhiko Endo, Yongxun Liu, Shin-ichi O'Uchi, Meishoku Masahara, Hiroyuki Ota:
Variation behavior of tunnel-FETs originated from dopant concentration at source region and channel edge configuration. ESSDERC 2014: 278-281
2013
[c5]
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  dblp key:
  - conf/essderc/MoritaMMMTFMEOLMO13
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  - https://dblp.org/rec/conf/essderc/MoritaMMMTFMEOLMO13
Yukinori Morita, Takahiro Mori, Shinji Migita, Wataru Mizubayashi, Akihito Tanabe, Koichi Fukuda, Takashi Matsukawa, Kazuhiko Endo, Shin-ichi O'Uchi, Yongxun Liu, Meishoku Masahara, Hiroyuki Ota:
Performance limit of parallel electric field tunnel FET and improvement by modified gate and channel configurations. ESSDERC 2013: 45-48
[c4]
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  dblp key:
  - conf/essderc/MizubayashiFMELMOIMMTTYMO13
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  - https://dblp.org/rec/conf/essderc/MizubayashiFMELMOIMMTTYMO13
Wataru Mizubayashi, Koichi Fukuda, Takahiro Mori, Kazuhiko Endo, Yongxun Liu, Takashi Matsukawa, Shin-ichi O'Uchi, Yuki Ishikawa, Shinji Migita, Yukinori Morita, Akihito Tanabe, Junichi Tsukada, Hiromi Yamauchi, Meishoku Masahara, Hiroyuki Ota:
Guidelines for symmetric threshold voltage in tunnel FinFETs with single and dual metal gate electrodes. ESSDERC 2013: 202-205
2012
[c3]
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  dblp key:
  - conf/essderc/MoritaMMMO12
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  - https://dblp.org/rec/conf/essderc/MoritaMMMO12
Yukinori Morita, Shinji Migita, Wataru Mizubayashi, Meishoku Masahara, Hiroyuki Ota:
Two-step annealing effects on ultrathin EOT higher-k (k = 40) ALD-HfO2 gate stacks. ESSDERC 2012: 81-84
2005
[j1]
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  dblp key:
  - journals/mr/MizubayashiYOOHITYHN05
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  - https://dblp.org/rec/journals/mr/MizubayashiYOOHITYHN05
Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame:
Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. Microelectron. Reliab. 45(7-8): 1041-1050 (2005)

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