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Scott Roy
Publications
- 2013
- [j11]Negin Moezi, Daryoosh Dideban, Binjie Cheng, Scott Roy, Asen Asenov:
Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study. Microelectron. J. 44(1): 7-14 (2013) - [c18]Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov:
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT 2013: 29-32 - 2012
- [c17]Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov:
An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC 2012: 205-208 - 2011
- [j10]James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell:
The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. 12(3): 235-256 (2011) - [c15]Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov:
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE 2011: 1537-1540 - 2010
- [j9]Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov:
Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Des. Test Comput. 27(2): 26-35 (2010) - [c13]Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy:
Modeling and simulation of transistor and circuit variability and reliability. CICC 2010: 1-8 - [c12]Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov:
Capturing intrinsic parameter fluctuations using the PSP compact model. DATE 2010: 650-653 - 2009
- [c10]Noor Ain Kamsani, Binjie Cheng, Scott Roy, Asen Asenov:
Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability. ISCAS 2009: 577-580 - [c9]Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart:
Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC 2009: 369-378 - 2008
- [j6]Muhammad Faiz Bukhori, Scott Roy, Asen Asenov:
Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. Microelectron. Reliab. 48(8-9): 1549-1552 (2008) - [j5]Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov:
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. 48(8-9): 1572-1575 (2008) - [c8]Richard O. Sinnott, Christopher Bayliss, C. Davenhall, Bruno Harbulot, Mike Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov:
Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience 2008: 87-94 - [c7]Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, Bruno Harbulot, M. Jones:
Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA 2008: 71-79 - 2007
- [c5]Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart:
Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience 2007: 305-311 - [c4]Binjie Cheng, Scott Roy, A. Asenov:
The scalability of 8T-SRAM cells under the influence of intrinsic parameter fluctuations. ESSCIRC 2007: 93-96 - 2004
- [j3]L. Yang, Asen Asenov, Jeremy R. Watling, M. Boriçi, John R. Barker, Scott Roy, K. Elgaid, Iain Thayne, T. Hackbarth:
Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. Microelectron. Reliab. 44(7): 1101-1107 (2004) - [c2]Binjie Cheng, Scott Roy, Asen Asenov:
The impact of random doping effects on CMOS SRAM cell. ESSCIRC 2004: 219-222 - 1998
- [j1]Asen Asenov, Andrew R. Brown, Scott Roy, John R. Barker:
Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices. VLSI Design 6(1-4): 91-95 (1998) - 1996
- [c1]Scott Roy, Asen Asenov, John R. Barker:
Optimum partitioning of topologically rectangular grids. EUROSIM 1996: 179-185
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