Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

Nicolas Boumal

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with William E. Leeb

> Home > Persons > Nicolas Boumal

Publications

2023
[j14]
- view
  authority control:
- export record
  dblp key:
  - journals/siamis/BendoryBLLS23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/siamis/BendoryBLLS23
Tamir Bendory, Nicolas Boumal, William E. Leeb, Eitan Levin, Amit Singer:
Toward Single Particle Reconstruction without Particle Picking: Breaking the Detection Limit. SIAM J. Imaging Sci. 16(2): 886-910 (2023)
2019
[i14]
- view
  - electronic edition @ arxiv.org (open access)
  - references & citations
- export record
  dblp key:
  - journals/corr/abs-1903-06022
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1903-06022
Tamir Bendory, Nicolas Boumal, William E. Leeb, Eitan Levin, Amit Singer:
Multi-target detection with application to cryo-electron microscopy. CoRR abs/1903.06022 (2019)
2018
[i9]
- view
  - electronic edition @ arxiv.org (open access)
  - references & citations
- export record
  dblp key:
  - journals/corr/abs-1810-00226
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1810-00226
Tamir Bendory, Nicolas Boumal, William E. Leeb, Eitan Levin, Amit Singer:
Toward single particle reconstruction without particle picking: Breaking the detection limit. CoRR abs/1810.00226 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.