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BibTeX record conf/apccas/Marinissen10
@inproceedings{DBLP:conf/apccas/Marinissen10, author = {Erik Jan Marinissen}, title = {Challenges in testing TSV-based 3D stacked ICs: Test flows, test contents, and test access}, booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2010, Kuala Lumpur, Malaysia, December 6-9, 2010}, pages = {544--547}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/APCCAS.2010.5775087}, doi = {10.1109/APCCAS.2010.5775087}, timestamp = {Mon, 05 Feb 2024 20:31:26 +0100}, biburl = {https://dblp.org/rec/conf/apccas/Marinissen10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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