BibTeX record conf/ats/KajiharaMK99

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@inproceedings{DBLP:conf/ats/KajiharaMK99,
  author       = {Seiji Kajihara and
                  Atsushi Murakami and
                  Tomohisa Kaneko},
  title        = {On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {20--24},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810724},
  doi          = {10.1109/ATS.1999.810724},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KajiharaMK99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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