BibTeX record conf/ats/KoN04

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@inproceedings{DBLP:conf/ats/KoN04,
  author       = {Ho Fai Ko and
                  Nicola Nicolici},
  title        = {Functional Scan Chain Design at {RTL} for Skewed-Load Delay Fault
                  Testing},
  booktitle    = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
                  Taiwan},
  pages        = {454--459},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ATS.2004.47},
  doi          = {10.1109/ATS.2004.47},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KoN04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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