BibTeX record conf/ats/RavikumarSA95

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@inproceedings{DBLP:conf/ats/RavikumarSA95,
  author       = {C. P. Ravikumar and
                  Gurjeet S. Saund and
                  Nidhi Agrawal},
  title        = {A STAFAN-like functional testability measure for register-level circuits},
  booktitle    = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore,
                  India},
  pages        = {192--198},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/ATS.1995.485336},
  doi          = {10.1109/ATS.1995.485336},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/RavikumarSA95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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