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BibTeX record conf/ats/YamadaYM95
@inproceedings{DBLP:conf/ats/YamadaYM95, author = {Teruhiko Yamada and Koji Yamazaki and Edward J. McCluskey}, title = {A simple technique for locating gate-level faults in combinational circuits}, booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore, India}, pages = {65--70}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ATS.1995.485318}, doi = {10.1109/ATS.1995.485318}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/YamadaYM95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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