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BibTeX record conf/dac/BanY11
@inproceedings{DBLP:conf/dac/BanY11, author = {Yongchan Ban and Jae{-}Seok Yang}, editor = {Leon Stok and Nikil D. Dutt and Soha Hassoun}, title = {Layout aware line-edge roughness modeling and poly optimization for leakage minimization}, booktitle = {Proceedings of the 48th Design Automation Conference, {DAC} 2011, San Diego, California, USA, June 5-10, 2011}, pages = {447--452}, publisher = {{ACM}}, year = {2011}, url = {https://doi.org/10.1145/2024724.2024828}, doi = {10.1145/2024724.2024828}, timestamp = {Tue, 06 Nov 2018 16:58:15 +0100}, biburl = {https://dblp.org/rec/conf/dac/BanY11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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