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BibTeX record conf/dac/LeeKMSMZB16
@inproceedings{DBLP:conf/dac/LeeKMSMZB16, author = {Doowon Lee and Tom Kolan and Arkadiy Morgenshtein and Vitali Sokhin and Ronny Morad and Avi Ziv and Valeria Bertacco}, title = {Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification}, booktitle = {Proceedings of the 53rd Annual Design Automation Conference, {DAC} 2016, Austin, TX, USA, June 5-9, 2016}, pages = {24:1--24:6}, publisher = {{ACM}}, year = {2016}, url = {https://doi.org/10.1145/2897937.2898072}, doi = {10.1145/2897937.2898072}, timestamp = {Tue, 06 Nov 2018 16:58:19 +0100}, biburl = {https://dblp.org/rec/conf/dac/LeeKMSMZB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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