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BibTeX record conf/dac/SrivastavaSASBD05
@inproceedings{DBLP:conf/dac/SrivastavaSASBD05, author = {Ashish Srivastava and Saumil Shah and Kanak Agarwal and Dennis Sylvester and David T. Blaauw and Stephen W. Director}, editor = {William H. Joyner Jr. and Grant Martin and Andrew B. Kahng}, title = {Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance}, booktitle = {Proceedings of the 42nd Design Automation Conference, {DAC} 2005, San Diego, CA, USA, June 13-17, 2005}, pages = {535--540}, publisher = {{ACM}}, year = {2005}, url = {https://doi.org/10.1145/1065579.1065718}, doi = {10.1145/1065579.1065718}, timestamp = {Tue, 06 Nov 2018 16:58:15 +0100}, biburl = {https://dblp.org/rec/conf/dac/SrivastavaSASBD05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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