BibTeX record conf/dac/SrivastavaSASBD05

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@inproceedings{DBLP:conf/dac/SrivastavaSASBD05,
  author       = {Ashish Srivastava and
                  Saumil Shah and
                  Kanak Agarwal and
                  Dennis Sylvester and
                  David T. Blaauw and
                  Stephen W. Director},
  editor       = {William H. Joyner Jr. and
                  Grant Martin and
                  Andrew B. Kahng},
  title        = {Accurate and efficient gate-level parametric yield estimation considering
                  correlated variations in leakage power and performance},
  booktitle    = {Proceedings of the 42nd Design Automation Conference, {DAC} 2005,
                  San Diego, CA, USA, June 13-17, 2005},
  pages        = {535--540},
  publisher    = {{ACM}},
  year         = {2005},
  url          = {https://doi.org/10.1145/1065579.1065718},
  doi          = {10.1145/1065579.1065718},
  timestamp    = {Tue, 06 Nov 2018 16:58:15 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/SrivastavaSASBD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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