BibTeX record conf/date/JutmanLLRJRKKE17

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@inproceedings{DBLP:conf/date/JutmanLLRJRKKE17,
  author       = {Artur Jutman and
                  Christophe Lotz and
                  Erik Larsson and
                  Matteo Sonza Reorda and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Hans G. Kerkhoff and
                  Rene Krenz{-}Baath and
                  Piet Engelke},
  editor       = {David Atienza and
                  Giorgio Di Natale},
  title        = {{BASTION:} Board and SoC test instrumentation for ageing and no failure
                  found},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages        = {115--120},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.23919/DATE.2017.7926968},
  doi          = {10.23919/DATE.2017.7926968},
  timestamp    = {Sun, 25 Oct 2020 23:15:41 +0100},
  biburl       = {https://dblp.org/rec/conf/date/JutmanLLRJRKKE17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}