BibTeX record conf/ddecs/ViilukasRJUK10

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@inproceedings{DBLP:conf/ddecs/ViilukasRJUK10,
  author       = {Taavi Viilukas and
                  Jaan Raik and
                  Maksim Jenihhin and
                  Raimund Ubar and
                  Anna Krivenko},
  editor       = {Elena Gramatov{\'{a}} and
                  Zdenek Kot{\'{a}}sek and
                  Andreas Steininger and
                  Heinrich Theodor Vierhaus and
                  Horst Zimmermann},
  title        = {Constraint-based test pattern generation at the Register-Transfer
                  Level},
  booktitle    = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
                  2010},
  pages        = {352--357},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DDECS.2010.5491752},
  doi          = {10.1109/DDECS.2010.5491752},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/ViilukasRJUK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}