BibTeX record conf/dft/BahlRKKCTNR14

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@inproceedings{DBLP:conf/dft/BahlRKKCTNR14,
  author       = {Swapnil Bahl and
                  Shreyans Rungta and
                  Shray Khullar and
                  Rohit Kapur and
                  Anshuman Chandra and
                  Salvatore Talluto and
                  Pramod Notiyath and
                  Ajay Rajagopalan},
  title        = {Unifying scan compression},
  booktitle    = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
                  October 1-3, 2014},
  pages        = {191--196},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/DFT.2014.6962079},
  doi          = {10.1109/DFT.2014.6962079},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BahlRKKCTNR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}