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BibTeX record conf/dft/WangWI04
@inproceedings{DBLP:conf/dft/WangWI04, author = {Baosheng Wang and Yuejian Wu and Andr{\'{e}} Ivanov}, title = {Designs for Reducing Test Time of Distributed Small Embedded SRAMs}, booktitle = {19th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2004), 10-13 October 2004, Cannes, France, Proceedings}, pages = {120--128}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.ieeecomputersociety.org/10.1109/DFT.2004.25}, doi = {10.1109/DFT.2004.25}, timestamp = {Fri, 24 Mar 2023 00:02:09 +0100}, biburl = {https://dblp.org/rec/conf/dft/WangWI04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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