BibTeX record conf/dsn/TanDGBL17

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@inproceedings{DBLP:conf/dsn/TanDGBL17,
  author       = {Li Tan and
                  Nathan DeBardeleben and
                  Qiang Guan and
                  Sean Blanchard and
                  Michael Lang},
  title        = {{RSVP:} Soft Error Resilient Power Savings at Near-Threshold Voltage
                  Using Register Vulnerability},
  booktitle    = {47th Annual {IEEE/IFIP} International Conference on Dependable Systems
                  and Networks Workshops, {DSN} Workshops 2017, Denver, CO, USA, June
                  26-29, 2017},
  pages        = {91--98},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DSN-W.2017.19},
  doi          = {10.1109/DSN-W.2017.19},
  timestamp    = {Fri, 24 Mar 2023 00:01:46 +0100},
  biburl       = {https://dblp.org/rec/conf/dsn/TanDGBL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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