BibTeX record conf/esem/YanFLXZ17

download as .bib file

@inproceedings{DBLP:conf/esem/YanFLXZ17,
  author       = {Meng Yan and
                  Yicheng Fang and
                  David Lo and
                  Xin Xia and
                  Xiaohong Zhang},
  editor       = {Ayse Bener and
                  Burak Turhan and
                  Stefan Biffl},
  title        = {File-Level Defect Prediction: Unsupervised vs. Supervised Models},
  booktitle    = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
                  and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
                  2017},
  pages        = {344--353},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESEM.2017.48},
  doi          = {10.1109/ESEM.2017.48},
  timestamp    = {Sat, 30 Sep 2023 09:40:24 +0200},
  biburl       = {https://dblp.org/rec/conf/esem/YanFLXZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.