BibTeX record conf/ets/MarinissenZKHHC16

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@inproceedings{DBLP:conf/ets/MarinissenZKHHC16,
  author       = {Erik Jan Marinissen and
                  Yervant Zorian and
                  Mario Konijnenburg and
                  Chih{-}Tsun Huang and
                  Ping{-}Hsuan Hsieh and
                  Peter Cockburn and
                  Jeroen Delvaux and
                  Vladimir Rozic and
                  Bohan Yang and
                  Dave Singel{\'{e}}e and
                  Ingrid Verbauwhede and
                  Cedric Mayor and
                  Robert Van Rijsinge and
                  Cocoy Reyes},
  title        = {IoT: Source of test challenges},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519331},
  doi          = {10.1109/ETS.2016.7519331},
  timestamp    = {Mon, 05 Feb 2024 20:31:45 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MarinissenZKHHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}