BibTeX record conf/iccad/AwadTTK14

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@inproceedings{DBLP:conf/iccad/AwadTTK14,
  author       = {Ahmed Awad and
                  Atsushi Takahashi and
                  Satoshi Tanaka and
                  Chikaaki Kodama},
  editor       = {Yao{-}Wen Chang},
  title        = {A fast process variation and pattern fidelity aware mask optimization
                  algorithm},
  booktitle    = {The {IEEE/ACM} International Conference on Computer-Aided Design,
                  {ICCAD} 2014, San Jose, CA, USA, November 3-6, 2014},
  pages        = {238--245},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ICCAD.2014.7001358},
  doi          = {10.1109/ICCAD.2014.7001358},
  timestamp    = {Mon, 01 May 2023 13:01:07 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/AwadTTK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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