BibTeX record conf/iccad/MuWYCCTT10

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@inproceedings{DBLP:conf/iccad/MuWYCCTT10,
  author       = {Szu{-}Pang Mu and
                  Yi{-}Ming Wang and
                  Hao{-}Yu Yang and
                  Mango Chia{-}Tso Chao and
                  Shi{-}Hao Chen and
                  Chih{-}Mou Tseng and
                  Tsung{-}Ying Tsai},
  editor       = {Louis Scheffer and
                  Joel R. Phillips and
                  Alan J. Hu},
  title        = {Testing methods for detecting stuck-open power switches in coarse-grain
                  {MTCMOS} designs},
  booktitle    = {2010 International Conference on Computer-Aided Design, {ICCAD} 2010,
                  San Jose, CA, USA, November 7-11, 2010},
  pages        = {155--161},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ICCAD.2010.5654118},
  doi          = {10.1109/ICCAD.2010.5654118},
  timestamp    = {Fri, 24 Mar 2023 00:01:53 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/MuWYCCTT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}