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BibTeX record conf/icicdt/KawasumiTHKTNSY12
@inproceedings{DBLP:conf/icicdt/KawasumiTHKTNSY12, author = {Atsushi Kawasumi and Yasuhisa Takeyama and Osamu Hirabayashi and Keiichi Kushida and Fumihiko Tachibana and Yusuke Niki and Shinichi Sasaki and Tomoaki Yabe}, title = {Energy efficiency deterioration by variability in {SRAM} and circuit techniques for energy saving without voltage reduction}, booktitle = {{IEEE} International Conference on {IC} Design {\&} Technology, {ICICDT} 2012, Austin, TX, USA, May 30 - June 1, 2012}, pages = {1--4}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ICICDT.2012.6232859}, doi = {10.1109/ICICDT.2012.6232859}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/icicdt/KawasumiTHKTNSY12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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