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BibTeX record conf/icip/RavindranFPN07
@inproceedings{DBLP:conf/icip/RavindranFPN07, author = {P. Ravindran and Nicola J. Ferrier and S. M. Park and P. F. Nealey}, title = {Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures}, booktitle = {Proceedings of the International Conference on Image Processing, {ICIP} 2007, September 16-19, 2007, San Antonio, Texas, {USA}}, pages = {329--332}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/ICIP.2007.4380021}, doi = {10.1109/ICIP.2007.4380021}, timestamp = {Sat, 09 Apr 2022 12:40:37 +0200}, biburl = {https://dblp.org/rec/conf/icip/RavindranFPN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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