BibTeX record conf/icip/RavindranFPN07

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@inproceedings{DBLP:conf/icip/RavindranFPN07,
  author       = {P. Ravindran and
                  Nicola J. Ferrier and
                  S. M. Park and
                  P. F. Nealey},
  title        = {Image Based Metrology for Quantitative Analysis of Local Structural
                  Similarity of Nanostructures},
  booktitle    = {Proceedings of the International Conference on Image Processing, {ICIP}
                  2007, September 16-19, 2007, San Antonio, Texas, {USA}},
  pages        = {329--332},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ICIP.2007.4380021},
  doi          = {10.1109/ICIP.2007.4380021},
  timestamp    = {Sat, 09 Apr 2022 12:40:37 +0200},
  biburl       = {https://dblp.org/rec/conf/icip/RavindranFPN07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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