BibTeX record conf/icse/Li0WS22

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@inproceedings{DBLP:conf/icse/Li0WS22,
  author       = {Chengpeng Li and
                  Chenguang Zhu and
                  Wenxi Wang and
                  August Shi},
  title        = {Repairing Order-Dependent Flaky Tests via Test Generation},
  booktitle    = {44th {IEEE/ACM} 44th International Conference on Software Engineering,
                  {ICSE} 2022, Pittsburgh, PA, USA, May 25-27, 2022},
  pages        = {1881--1892},
  publisher    = {{ACM}},
  year         = {2022},
  url          = {https://doi.org/10.1145/3510003.3510173},
  doi          = {10.1145/3510003.3510173},
  timestamp    = {Mon, 18 Jul 2022 16:47:42 +0200},
  biburl       = {https://dblp.org/rec/conf/icse/Li0WS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}