BibTeX record conf/icst/LacknerTWW14

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@inproceedings{DBLP:conf/icst/LacknerTWW14,
  author       = {Hartmut Lackner and
                  Martin Thomas and
                  Florian Wartenberg and
                  Stephan Wei{\ss}leder},
  title        = {Model-Based Test Design of Product Lines: Raising Test Design to the
                  Product Line Level},
  booktitle    = {Seventh {IEEE} International Conference on Software Testing, Verification
                  and Validation, {ICST} 2014, March 31 2014-April 4, 2014, Cleveland,
                  Ohio, {USA}},
  pages        = {51--60},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/ICST.2014.16},
  doi          = {10.1109/ICST.2014.16},
  timestamp    = {Thu, 23 Mar 2023 23:58:21 +0100},
  biburl       = {https://dblp.org/rec/conf/icst/LacknerTWW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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