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BibTeX record conf/icst/ShinYB16
@inproceedings{DBLP:conf/icst/ShinYB16, author = {Donghwan Shin and Shin Yoo and Doo{-}Hwan Bae}, title = {Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability}, booktitle = {Ninth {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2016, Chicago, IL, USA, April 11-15, 2016}, pages = {122--131}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/ICSTW.2016.37}, doi = {10.1109/ICSTW.2016.37}, timestamp = {Thu, 23 Mar 2023 23:58:20 +0100}, biburl = {https://dblp.org/rec/conf/icst/ShinYB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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