BibTeX record conf/icst/ShinYB16

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@inproceedings{DBLP:conf/icst/ShinYB16,
  author       = {Donghwan Shin and
                  Shin Yoo and
                  Doo{-}Hwan Bae},
  title        = {Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection
                  Capability},
  booktitle    = {Ninth {IEEE} International Conference on Software Testing, Verification
                  and Validation Workshops, {ICST} Workshops 2016, Chicago, IL, USA,
                  April 11-15, 2016},
  pages        = {122--131},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ICSTW.2016.37},
  doi          = {10.1109/ICSTW.2016.37},
  timestamp    = {Thu, 23 Mar 2023 23:58:20 +0100},
  biburl       = {https://dblp.org/rec/conf/icst/ShinYB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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