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BibTeX record conf/isqed/NakataKOJSTNNYFNKKY14
@inproceedings{DBLP:conf/isqed/NakataKOJSTNNYFNKKY14, author = {Yohei Nakata and Yuta Kimi and Shunsuke Okumura and Jinwook Jung and Takuya Sawada and Taku Toshikawa and Makoto Nagata and Hirofumi Nakano and Makoto Yabuuchi and Hidehiro Fujiwara and Koji Nii and Hiroyuki Kawai and Hiroshi Kawaguchi and Masahiko Yoshimoto}, title = {A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering {\texttimes}91 failure rate improvement}, booktitle = {Fifteenth International Symposium on Quality Electronic Design, {ISQED} 2014, Santa Clara, CA, USA, March 3-5, 2014}, pages = {16--23}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ISQED.2014.6783301}, doi = {10.1109/ISQED.2014.6783301}, timestamp = {Mon, 11 Mar 2024 15:42:29 +0100}, biburl = {https://dblp.org/rec/conf/isqed/NakataKOJSTNNYFNKKY14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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