Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record conf/isqed/ZhouKALJNS09
@inproceedings{DBLP:conf/isqed/ZhouKALJNS09, author = {Nancy Ying Zhou and Rouwaida Kanj and Kanak Agarwal and Zhuo Li and Rajiv V. Joshi and Sani R. Nassif and Weiping Shi}, title = {The impact of {BEOL} lithography effects on the {SRAM} cell performance and yield}, booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED} 2009), 16-18 March 2009, San Jose, CA, {USA}}, pages = {607--612}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/ISQED.2009.4810363}, doi = {10.1109/ISQED.2009.4810363}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/ZhouKALJNS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.