BibTeX record conf/isscc/OhbayashiYKOIUYINTAUOIMIS07

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@inproceedings{DBLP:conf/isscc/OhbayashiYKOIUYINTAUOIMIS07,
  author       = {Shigeki Ohbayashi and
                  Makoto Yabuuchi and
                  Kazushi Kono and
                  Yuji Oda and
                  Susumu Imaoka and
                  Keiichi Usui and
                  Toshiaki Yonezu and
                  Takeshi Iwamoto and
                  Koji Nii and
                  Yasumasa Tsukamoto and
                  Masashi Arakawa and
                  Takahiro Uchida and
                  Masakazu Okada and
                  Atsushi Ishii and
                  Hiroshi Makino and
                  Koichiro Ishibashi and
                  Hirofumi Shinohara},
  title        = {A 65nm Embedded {SRAM} with Wafer-Level Burn-In Mode, Leak-Bit Redundancy
                  and E-Trim Fuse for Known Good Die},
  booktitle    = {2007 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2007, Digest of Technical Papers, San Francisco, CA, USA, February
                  11-15, 2007},
  pages        = {488--617},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISSCC.2007.373507},
  doi          = {10.1109/ISSCC.2007.373507},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/OhbayashiYKOIUYINTAUOIMIS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}