BibTeX record conf/issta/XinR17

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@inproceedings{DBLP:conf/issta/XinR17,
  author       = {Qi Xin and
                  Steven P. Reiss},
  editor       = {Tevfik Bultan and
                  Koushik Sen},
  title        = {Identifying test-suite-overfitted patches through test case generation},
  booktitle    = {Proceedings of the 26th {ACM} {SIGSOFT} International Symposium on
                  Software Testing and Analysis, Santa Barbara, CA, USA, July 10 - 14,
                  2017},
  pages        = {226--236},
  publisher    = {{ACM}},
  year         = {2017},
  url          = {https://doi.org/10.1145/3092703.3092718},
  doi          = {10.1145/3092703.3092718},
  timestamp    = {Tue, 06 Nov 2018 16:57:30 +0100},
  biburl       = {https://dblp.org/rec/conf/issta/XinR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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