BibTeX record conf/itc/BehARV82

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@inproceedings{DBLP:conf/itc/BehARV82,
  author       = {C. C. Beh and
                  K. H. Arya and
                  Charles E. Radke and
                  E. Kofi Vida{-}Torku},
  title        = {Do Stuck Fault Models Reflect Manufacturing Defects?},
  booktitle    = {Proceedings International Test Conference 1982, Philadelphia, PA,
                  USA, November 1982},
  pages        = {35--42},
  publisher    = {{IEEE} Computer Society},
  year         = {1982},
  timestamp    = {Wed, 23 Oct 2002 15:42:03 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/BehARV82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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