BibTeX record conf/itc/OommanCW96

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@inproceedings{DBLP:conf/itc/OommanCW96,
  author       = {Bejoy G. Oomman and
                  Wu{-}Tung Cheng and
                  John A. Waicukauski},
  title        = {A Universal Technique for Accelerating Simulation of Scan Test Patterns},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {135--141},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.556955},
  doi          = {10.1109/TEST.1996.556955},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OommanCW96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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