BibTeX record conf/itc/SashoS96

download as .bib file

@inproceedings{DBLP:conf/itc/SashoS96,
  author       = {Seiji Sasho and
                  Teruhisa Sakata},
  title        = {Four Multi Probing Test for 16 Bit {DAC} with Vertical Contact Probe
                  Card},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {86--91},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.556948},
  doi          = {10.1109/TEST.1996.556948},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SashoS96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.