BibTeX record conf/itc/SicardK90

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@inproceedings{DBLP:conf/itc/SicardK90,
  author       = {Etienne Sicard and
                  Kozo Kinoshita},
  title        = {On the evaluation of process-fault tolerance ability of {CMOS} integrated
                  circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {948--954},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114115},
  doi          = {10.1109/TEST.1990.114115},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SicardK90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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