BibTeX record conf/itc/WuL16

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@inproceedings{DBLP:conf/itc/WuL16,
  author       = {Cheng{-}Hung Wu and
                  Kuen{-}Jong Lee},
  title        = {Transformation of multiple fault models to a unified model for {ATPG}
                  efficiency enhancement},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805866},
  doi          = {10.1109/TEST.2016.7805866},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/WuL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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