BibTeX record conf/mtdt/NiggemeyerRR00

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@inproceedings{DBLP:conf/mtdt/NiggemeyerRR00,
  author       = {Dirk Niggemeyer and
                  Elizabeth M. Rudnick and
                  Michael Redeker},
  title        = {Diagnostic Testing of Embedded Memories Based on Output Tracing},
  booktitle    = {8th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2000), 7-8 August 2000, San Jose, CA, {USA}},
  pages        = {113--118},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/MTDT.2000.868624},
  doi          = {10.1109/MTDT.2000.868624},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/NiggemeyerRR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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