BibTeX record conf/natw/ValiN15

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@inproceedings{DBLP:conf/natw/ValiN15,
  author       = {Amin Vali and
                  Nicola Nicolici},
  title        = {Satisfiability-Based Analysis of Failing Traces during Post-silicon
                  Debug},
  booktitle    = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
                  NY, USA, May 11-13, 2015},
  pages        = {17--22},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/NATW.2015.16},
  doi          = {10.1109/NATW.2015.16},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ValiN15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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